A Radiometric Analysis of Projected Sinusoidal Illumination for Opaque Surfaces

Report
Authors:Holroyd, Michael, Department of Computer ScienceUniversity of Virginia Lawrence, Jason, Department of Computer ScienceUniversity of Virginia Zickler, Todd, Department of Computer ScienceUniversity of Virginia
Abstract:

Shifted sinusoidal illumination patterns are useful for appearance capture because they simultane- ously separate local and non-local reflections and allow the recovery of surface geometry. Here we show that the same illumination patterns can be used to estimate the local surface reflectance (BRDF) as well, provided that an appropriate correction factor is applied. We derive a closed-form expression for this correction factor, validate it experimentally, and discuss its implications.

Rights:
All rights reserved (no additional license for public reuse)
Language:
English
Source Citation:

Holroyd, Michael, Jason Lawrence, and Todd Zickler. "A Radiometric Analysis of Projected Sinusoidal Illumination for Opaque Surfaces." University of Virginia Dept. of Computer Science Tech Report (2010).

Publisher:
University of Virginia, Department of Computer Science
Published Date:
2010